January 21, 2016

SYSTEMA Expert Day in cooperation with HSEB

SYSTEMA is pleased to announce its annual Expert Day themed "200mm Fab Enhancement" 

on January 21, 2016 at SYSTEMA in Dresden.

Agenda:

  8:30      Registration
  9:00  

Welcome SYSTEMA and HSEB

   9:15  

„Fully-automated optical inspection systems enabling SPC-ready data“  

Dr. Susan Duerigen – HSEB

   9:45

„Wafer Signature Detection – automatic defect recognition and classification“ 

André Schaaf – SYSTEMA, Dr. Susan Duerigen – HSEB

 10:15  

Coffee Break

 10:45

"Equipment Data-Driven Continuous Improvement for 200mm Fabs" 

Alan Weber - Cimetrix

 11:15

"Binning - optimized procedure to select components for module assembly"

Dr. Mike Gißrau - SYSTEMA

 11:45  

Q&A

 12:00  

End and transfer to 13th Innoforum for automation

Presenting companies:

   

 

 

 

Abstracts of speeches

Please register here.

We look forward to meeting you.

 

For more Information please contact:

Christfried Nicolaus

+49 351 / 88 24 853

Head of Marketing

SYSTEMA GmbH

 
SYSTEMA Expert Day, Dresden